Characterization And Spectroscopy Of Thin Films

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Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells
Author :
Publisher : John Wiley & Sons
Total Pages : 760
Release :
ISBN-10 : 9783527699018
ISBN-13 : 3527699015
Rating : 4/5 (015 Downloads)

Book Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras

Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Daniel Abou-Ras and published by John Wiley & Sons. This book was released on 2016-07-13 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.


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Advanced Characterization Techniques for Thin Film Solar Cells
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Type: BOOK - Published: 2016-07-13 - Publisher: John Wiley & Sons

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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic re
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This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various app
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Handbook of Thin Film Materials: Characterization and spectroscopy of thin films
Language: en
Pages: 816
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Vol.1: Deposition and processing of thin films; Vol.2: Characterization and spectroscopy of thin films; Vol.3: Ferroelectric and dielectric thin films; Vol.4: S
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An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in