Oxide Semiconductors Volume 1633

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Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits

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Total Pages	: 378
Release	: 2005
ISBN-10	: UOM:39015058329940
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Rating	: 4/5 ( Downloads)

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Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits Related Books

Language: en
Pages: 378

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits

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Lately, there has been a growing interest in exploiting the benefits of the ICs for areas outside of the traditional application spaces. One noteable area is fo

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Recent Advances in Multidisciplinary Applied Physics

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The 1st International Meeting on Applied Physics (APHYS-2003) succeeded in creating a new international forum for applied physics in Europe, with specific inter

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Nitride Semiconductors: Volume 482

Authors: Materials Research Society. Meeting

Categories: Technology & Engineering

Type: BOOK - Published: 1998-04-20 - Publisher:

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This book is on recent experimental and theoretical progress in the rapidly growing field of III-V nitrides. Issues related to crystal growth (bulk and thin fil