Polarimetry And Ellipsometry

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Ellipsometry at the Nanoscale

Ellipsometry at the Nanoscale
Author :
Publisher : Springer Science & Business Media
Total Pages : 740
Release :
ISBN-10 : 9783642339561
ISBN-13 : 3642339565
Rating : 4/5 (565 Downloads)

Book Synopsis Ellipsometry at the Nanoscale by : Maria Losurdo

Download or read book Ellipsometry at the Nanoscale written by Maria Losurdo and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.


Ellipsometry at the Nanoscale Related Books

Ellipsometry at the Nanoscale
Language: en
Pages: 740
Authors: Maria Losurdo
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-12 - Publisher: Springer Science & Business Media

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This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materi
Nonlinear Optical Polarization Analysis in Chemistry and Biology
Language: en
Pages: 499
Authors: Garth J. Simpson
Categories: Mathematics
Type: BOOK - Published: 2017-03-24 - Publisher: Cambridge University Press

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Presents a clear systematic molecular-based description of nonlinear optical polarization analysis of chemical and biological assemblies.
Spectroscopic Ellipsometry
Language: en
Pages: 388
Authors: Hiroyuki Fujiwara
Categories: Technology & Engineering
Type: BOOK - Published: 2007-09-27 - Publisher: John Wiley & Sons

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Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principle
Nonlinear Optical Polarization Analysis in Chemistry and Biology
Language: en
Pages: 499
Authors: Garth J. Simpson
Categories: Technology & Engineering
Type: BOOK - Published: 2017-03-24 - Publisher: Cambridge University Press

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This rigorous yet accessible guide presents a molecular-based description of nonlinear optical polarization analysis of chemical and biological assemblies. It i
Spectroscopic Ellipsometry
Language: en
Pages: 138
Authors: Harland G. Tompkins
Categories: Technology & Engineering
Type: BOOK - Published: 2015-12-16 - Publisher: Momentum Press

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Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thicknes