Research In Vlsi Reliability

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Very Large Scale Integration Reliability Research

Author	: Center for Semiconductor Device Reliability Research
Publisher	:
Total Pages	:
Release	: 1992
ISBN-10	: OCLC:819741338
ISBN-13	:
Rating	: 4/5 ( Downloads)

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Book Synopsis Very Large Scale Integration Reliability Research by : Center for Semiconductor Device Reliability Research

Download or read book Very Large Scale Integration Reliability Research written by Center for Semiconductor Device Reliability Research and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

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This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig

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Hot-Carrier Reliability of MOS VLSI Circuits

Authors: Yusuf Leblebici

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As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a