Rf Circuit Designs For Reliability And Process Variability Resilience
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Language: en
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CMOS devices are scaled down and beyond pose significant process variability and reliability issues. Negative biased temperature instability (NBTI) and hot carr
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The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits
Language: en
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Type: BOOK - Published: 2012 - Publisher:
Due to continued device dimensions scaling, CMOS transistors in the nanometer regime have resulted in major reliability and variability challenges. Reliability
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Pages: 150
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Type: BOOK - Published: 2011 - Publisher:
The work presents a novel voltage biasing design that helps the CMOS RF circuits resilient to variability and reliability. The biasing scheme provides resilienc
Language: en
Pages: 116
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Type: BOOK - Published: 2013 - Publisher:
CMOS RF circuit design has been an ever-lasting research field. It gained so much attention since RF circuits have high mobility and wide band efficiency, while