Computed Electron Micrographs And Defect Identification

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Computed Electron Micrographs And Defect Identification
Language: en
Pages: 413

Computed Electron Micrographs And Defect Identification

Authors: A.K. Head
Categories: Computers
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images,
Computed Electron Micrographs and Defect Identification
Language: en
Pages: 0

Computed Electron Micrographs and Defect Identification

Authors: a. k. Head (+and others)
Categories:
Type: BOOK - Published: 1973 - Publisher:

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Diffraction and Imaging Techniques in Material Science P1
Language: en
Pages: 472

Diffraction and Imaging Techniques in Material Science P1

Authors: S Amelinckx
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on th
Computed Electron Micrographs and Defect Humble
Language: en
Pages: 400

Computed Electron Micrographs and Defect Humble

Authors: A.K. Head
Categories:
Type: BOOK - Published: 1973 - Publisher:

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Computed Electron Micrographs and Defect Indentification
Language: en
Pages: 0

Computed Electron Micrographs and Defect Indentification

Authors:
Categories:
Type: BOOK - Published: 1973 - Publisher:

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