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Test Generation of Crosstalk Delay Faults in VLSI Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author :
Publisher : Springer
Total Pages : 161
Release :
ISBN-10 : 9789811324932
ISBN-13 : 981132493X
Rating : 4/5 (93X Downloads)

Book Synopsis Test Generation of Crosstalk Delay Faults in VLSI Circuits by : S. Jayanthy

Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.


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