Embedded Memories For Nano Scale Vlsis

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Embedded Memories for Nano-Scale VLSIs

Embedded Memories for Nano-Scale VLSIs
Author :
Publisher : Springer Science & Business Media
Total Pages : 390
Release :
ISBN-10 : 9780387884974
ISBN-13 : 0387884971
Rating : 4/5 (971 Downloads)

Book Synopsis Embedded Memories for Nano-Scale VLSIs by : Kevin Zhang

Download or read book Embedded Memories for Nano-Scale VLSIs written by Kevin Zhang and published by Springer Science & Business Media. This book was released on 2009-04-21 with total page 390 pages. Available in PDF, EPUB and Kindle. Book excerpt: Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet the increasing demand for higher performance and lower power consumption in many different system applications, it is often required to have a large amount of on-die or embedded memory to support the need of data bandwidth in a system. The varieties of embedded memory in a given system have alsobecome increasingly more complex, ranging fromstatictodynamic and volatile to nonvolatile. Among embedded memories, six-transistor (6T)-based static random access memory (SRAM) continues to play a pivotal role in nearly all VLSI systems due to its superior speed and full compatibility with logic process technology. But as the technology scaling continues, SRAM design is facing severe challenge in mainta- ing suf?cient cell stability margin under relentless area scaling. Meanwhile, rapid expansion in mobile application, including new emerging application in sensor and medical devices, requires far more aggressive voltage scaling to meet very str- gent power constraint. Many innovative circuit topologies and techniques have been extensively explored in recent years to address these challenges.


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