Fault Modeling and Testability of Domino CMOS Logic
Author | : Pavankumar Chandrasekhar |
Publisher | : |
Total Pages | : 114 |
Release | : 2006 |
ISBN-10 | : OCLC:237055425 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Fault Modeling and Testability of Domino CMOS Logic written by Pavankumar Chandrasekhar and published by . This book was released on 2006 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Domino CMOS circuits are widely used in high performance integrated circuits due to their advantages of speed, area, and power consumption over other logic families. However, testing of domino circuits is an area which still requires considerable attention. In this thesis two aspects of testing domino circuits are investigated. First, the effectiveness of popular fault models in detecting defects in domino circuits is studied. A design-for-test scheme targeted towards undetected faults is proposed and the feasibility of the scheme is proven. The second aspect that is examined is crosstalk due to capacitive circuit noise immunity in terms of signal switching speed and coupling capacitance. The validity of the model is demonstrated using SPICE simulations"--Abstract, leaf iii.