Materials Processes Integration And Reliability In Advanced Interconnects For Micro And Nanoelectronics Volume 990

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Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990

Author	: Qinghuang Lin
Publisher	:
Total Pages	: 366
Release	: 2007-09-12
ISBN-10	: UVA:X030257167
ISBN-13	:
Rating	: 4/5 ( Downloads)

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Book Synopsis Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 by : Qinghuang Lin

Download or read book Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 written by Qinghuang Lin and published by . This book was released on 2007-09-12 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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