Optical Properties Of Thin Solid Films

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Optical Properties of Thin Solid Films

Author	: O. S. Heavens
Publisher	: Courier Corporation
Total Pages	: 276
Release	: 1991-01-01
ISBN-10	: 9780486669243
ISBN-13	: 0486669246
Rating	: 4/5 (246 Downloads)

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Book Synopsis Optical Properties of Thin Solid Films by : O. S. Heavens

Download or read book Optical Properties of Thin Solid Films written by O. S. Heavens and published by Courier Corporation. This book was released on 1991-01-01 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.

Optical Properties of Thin Solid Films Related Books

Language: en
Pages: 276

Optical Properties of Thin Solid Films

Authors: O. S. Heavens

Categories: Science

Type: BOOK - Published: 1991-01-01 - Publisher: Courier Corporation

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Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 fi

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Optical Properties of Thin Solid Films

Authors: O. S. Heavens

Categories: Science

Type: BOOK - Published: 1991 - Publisher: Courier Corporation

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Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 fi

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Optical Properties of Materials and Their Applications

Authors: Jai Singh

Categories: Science

Type: BOOK - Published: 2020-01-07 - Publisher: John Wiley & Sons

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Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted exp

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Optical Characterization of Thin Solid Films

Authors: Olaf Stenzel

Categories: Science

Type: BOOK - Published: 2018-03-09 - Publisher: Springer

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This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various app

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Spectroscopic Ellipsometry

Authors: Hiroyuki Fujiwara

Categories: Technology & Engineering

Type: BOOK - Published: 2007-09-27 - Publisher: John Wiley & Sons

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Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principle