Research In Vlsi Reliability

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VLSI Reliability Research

Author	: J. W. Lathrop
Publisher	:
Total Pages	: 72
Release	: 1985
ISBN-10	: OCLC:84154989
ISBN-13	:
Rating	: 4/5 ( Downloads)

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Book Synopsis VLSI Reliability Research by : J. W. Lathrop

Download or read book VLSI Reliability Research written by J. W. Lathrop and published by . This book was released on 1985 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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In order to increase the circuit density and speed of VLSI systems, microelectronic device geometry is shrinking from a few microns to submicron and beyond. Thi

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This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig

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Hot-Carrier Reliability of MOS VLSI Circuits

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As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a