Tof Sims
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Language: en
Pages: 67
Pages: 67
Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m
Language: en
Pages: 742
Pages: 742
Type: BOOK - Published: 2013 - Publisher: IM Publications
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 y
Language: en
Pages: 292
Pages: 292
Type: BOOK - Published: 2007 - Publisher: Nova Publishers
This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the
Language: en
Pages: 267
Pages: 267
Type: BOOK - Published: 2016-03-24 - Publisher: Momentum Press
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with su
Language: en
Pages: 820
Pages: 820
Type: BOOK - Published: 2001 - Publisher:
Time-of-flight secondary ion mass spectroemtry is the most versatile of surface analysis techniques that has been developed. Following an overview, this work in
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