Analysis of CMOS Pre-charge Logic Testability
Author | : Rahul Kundu |
Publisher | : |
Total Pages | : 13 |
Release | : 1999 |
ISBN-10 | : OCLC:46869671 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Analysis of CMOS Pre-charge Logic Testability written by Rahul Kundu and published by . This book was released on 1999 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "Dynamic circuits are widely used in industry due to their area and speed advantages over static CMOS circuits. However, this increased speed and reduced area comes at the cost of higher power dissipation and noise, defect suceptibility [sic] and design complexity. This survey discusses different design corners and fault mechanisms for which the dynamic circuits are susceptible, given the trends in various CMOS technologies. It also discusses past testability work performed in the area of dynamic logic circuits."