Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures
Author | : Lianfeng Fu |
Publisher | : |
Total Pages | : 382 |
Release | : 2006 |
ISBN-10 | : UCAL:X75364 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures written by Lianfeng Fu and published by . This book was released on 2006 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: