Boundary Scan Interconnect Diagnosis
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Language: en
Pages: 178
Pages: 178
Type: BOOK - Published: 2005-12-28 - Publisher: Springer Science & Business Media
This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those
Language: en
Pages: 246
Pages: 246
Type: BOOK - Published: 1992-12-31 - Publisher: Springer Science & Business Media
The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-n
Language: en
Pages: 273
Pages: 273
Type: BOOK - Published: 2013-03-14 - Publisher: Springer Science & Business Media
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that a
Language: en
Pages: 393
Pages: 393
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time
Language: en
Pages: 251
Pages: 251
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system de
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