Distributed Large Scale Dimensional Metrology

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Distributed Large-Scale Dimensional Metrology

Distributed Large-Scale Dimensional Metrology
Author :
Publisher : Springer Science & Business Media
Total Pages : 241
Release :
ISBN-10 : 9780857295439
ISBN-13 : 0857295438
Rating : 4/5 (438 Downloads)

Book Synopsis Distributed Large-Scale Dimensional Metrology by : Fiorenzo Franceschini

Download or read book Distributed Large-Scale Dimensional Metrology written by Fiorenzo Franceschini and published by Springer Science & Business Media. This book was released on 2011-06-06 with total page 241 pages. Available in PDF, EPUB and Kindle. Book excerpt: The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.


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