Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

Download Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits full books in PDF, epub, and Kindle. Read online free Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author :
Publisher : Springer Science & Business Media
Total Pages : 690
Release :
ISBN-10 : 9780306470400
ISBN-13 : 0306470403
Rating : 4/5 (403 Downloads)

Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.


Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Related Books

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 712
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2004-12-15 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 712
Authors: M. Bushnell
Categories:
Type: BOOK - Published: 2014-01-15 - Publisher:

DOWNLOAD EBOOK

Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits
Language: en
Pages: 690
Authors: Michael Lee Bushnell
Categories: Digital integrated circuits
Type: BOOK - Published: 2000 - Publisher:

DOWNLOAD EBOOK

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Language: en
Pages: 203
Authors: Andrei Pavlov
Categories: Technology & Engineering
Type: BOOK - Published: 2008-06-01 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations t