Failure Analysis of Integrated Circuits
| Author | : Lawrence C. Wagner |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 274 |
| Release | : 1999-01-31 |
| ISBN-10 | : 0412145618 |
| ISBN-13 | : 9780412145612 |
| Rating | : 4/5 (612 Downloads) |
Book Synopsis Failure Analysis of Integrated Circuits by : Lawrence C. Wagner
Download or read book Failure Analysis of Integrated Circuits written by Lawrence C. Wagner and published by Springer Science & Business Media. This book was released on 1999-01-31 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
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