Hot Carrier Reliability Of Cmos Integrated Circuits

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Hot-carrier Reliability of CMOS Integrated Circuits

Hot-carrier Reliability of CMOS Integrated Circuits
Author :
Publisher :
Total Pages : 242
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ISBN-10 : UCAL:C3409181
ISBN-13 :
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Book Synopsis Hot-carrier Reliability of CMOS Integrated Circuits by : Jone Fang Chen

Download or read book Hot-carrier Reliability of CMOS Integrated Circuits written by Jone Fang Chen and published by . This book was released on 1998 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design