Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design
Author | : Yungseon Eo |
Publisher | : |
Total Pages | : 460 |
Release | : 1993 |
ISBN-10 | : OCLC:29860915 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design written by Yungseon Eo and published by . This book was released on 1993 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt: