Process Variations And Probabilistic Integrated Circuit Design

Download Process Variations And Probabilistic Integrated Circuit Design full books in PDF, epub, and Kindle. Read online free Process Variations And Probabilistic Integrated Circuit Design ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!

Process Variations and Probabilistic Integrated Circuit Design

Process Variations and Probabilistic Integrated Circuit Design
Author :
Publisher : Springer Science & Business Media
Total Pages : 261
Release :
ISBN-10 : 9781441966216
ISBN-13 : 1441966218
Rating : 4/5 (218 Downloads)

Book Synopsis Process Variations and Probabilistic Integrated Circuit Design by : Manfred Dietrich

Download or read book Process Variations and Probabilistic Integrated Circuit Design written by Manfred Dietrich and published by Springer Science & Business Media. This book was released on 2011-11-20 with total page 261 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.


Process Variations and Probabilistic Integrated Circuit Design Related Books

Process Variations and Probabilistic Integrated Circuit Design
Language: en
Pages: 261
Authors: Manfred Dietrich
Categories: Technology & Engineering
Type: BOOK - Published: 2011-11-20 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufactu
Three-Dimensional Integrated Circuit Design
Language: en
Pages: 770
Authors: Vasilis F. Pavlidis
Categories: Technology & Engineering
Type: BOOK - Published: 2017-07-04 - Publisher: Newnes

DOWNLOAD EBOOK

Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in cir
Extreme Statistics in Nanoscale Memory Design
Language: en
Pages: 254
Authors: Amith Singhee
Categories: Technology & Engineering
Type: BOOK - Published: 2010-09-09 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semicond
Timing Performance of Nanometer Digital Circuits Under Process Variations
Language: en
Pages: 195
Authors: Victor Champac
Categories: Technology & Engineering
Type: BOOK - Published: 2018-04-18 - Publisher: Springer

DOWNLOAD EBOOK

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-st
Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
Language: en
Pages: 91
Authors: Martin Wirnshofer
Categories: Technology & Engineering
Type: BOOK - Published: 2013-02-15 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Increasing performance demands in integrated circuits, together with limited energy budgets, force IC designers to find new ways of saving power. One innovative