Recent Developments In Atomic Force Microscopy And Raman Spectroscopy For Materials Characterization

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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Author :
Publisher : BoD – Books on Demand
Total Pages : 275
Release :
ISBN-10 : 9781839682292
ISBN-13 : 1839682299
Rating : 4/5 (299 Downloads)

Book Synopsis Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization by : Chandra Shakher Pathak

Download or read book Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization written by Chandra Shakher Pathak and published by BoD – Books on Demand. This book was released on 2022-01-07 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.


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