Spectroscopic Ellipsometry For Photovoltaics

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Spectroscopic Ellipsometry for Photovoltaics

Spectroscopic Ellipsometry for Photovoltaics
Author :
Publisher : Springer
Total Pages : 602
Release :
ISBN-10 : 9783319753775
ISBN-13 : 3319753770
Rating : 4/5 (770 Downloads)

Book Synopsis Spectroscopic Ellipsometry for Photovoltaics by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry for Photovoltaics written by Hiroyuki Fujiwara and published by Springer. This book was released on 2019-01-10 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.


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Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thicknes