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ToF-SIMS

Author	: J. C. Vickerman
Publisher	: IM Publications
Total Pages	: 742
Release	: 2013
ISBN-10	: 9781906715175
ISBN-13	: 1906715173
Rating	: 4/5 (173 Downloads)

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Book Synopsis ToF-SIMS by : J. C. Vickerman

Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

ToF-SIMS Related Books

Language: en
Pages: 742

ToF-SIMS

Authors: J. C. Vickerman

Categories: Mass spectrometry

Type: BOOK - Published: 2013 - Publisher: IM Publications

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 y

Language: en
Pages: 67

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Authors: Sarah Fearn

Categories: Technology & Engineering

Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m

Language: en
Pages: 292

New Trends and Potentialities of ToF-SIMS in Surface Studies

Authors: Jacek Grams

Categories: Science

Type: BOOK - Published: 2007 - Publisher: Nova Publishers

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This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the

Language: en
Pages: 267

The Practice of TOF-SIMS

Authors: Alan M. Spool

Categories: Technology & Engineering

Type: BOOK - Published: 2016-03-24 - Publisher: Momentum Press

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Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with su

Language: en
Pages: 820

ToF-SIMS

Authors: John C. Vickerman

Categories: Mass spectrometry

Type: BOOK - Published: 2001 - Publisher:

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Time-of-flight secondary ion mass spectroemtry is the most versatile of surface analysis techniques that has been developed. Following an overview, this work in